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Happy New Year 2012   |
 The Mel-Build policy. We are developing for user efficiency of Transmission Electron Microscopes. We are developing user friendly gadgets for all Transmission Electron Microscope users. We are developing for science advancement. We are to meliorate building of technology for users all over the world. The story of Mel-Build since 2005. First we realized the strong technological needs for further development
of 3D Tomography. Our first challenge was to make it possible to move a TEM sample for crystalline nanostructures. The project was to develop a completely new specimen holder for 3D tomography
purposes. This project started in the summer of 2005, it was involving several engineers
and high level TEM users. The project itself succeeded, and as another result the company Mel-Build
was founded. New ideas and technology are co-developed by Mel-Build and Kyushu university. Announcement.New! Our team's article 「電子線トモグラフィーによる格子欠陥の３次元可視化」 It was recognized "The 1st Materia Prize" by The Japan Institute of Metals. at 8 November 2011  http://wwwsoc.nii.ac.jp/jim/publications.html Our team's HATA Holder is awarded a Best Prize of contrivance branch at poster sessionby JSM-2010 The 66th Annual Meeting of the Japanese Society of Microscopy. Poster number: P-I43 Title: ( High Angle Triple Axis - Holder and applications ) 高傾斜3軸試料ホルダーとその応用 ( ○S.Hata,1, H.Miyazaki,2, M.Mitsuhara,1, K.Ogata,1, K.Ikeda,1, H. Nakashima,1 ) 1 Department
of Molecular and Materials, Interdisciplinary Graduate School of Engineering
Sciences, Kyushu University
2 Our Mel-Build Jump to our Gallery of the prize winner for photograph and poster competition. Trivia ! Jump to nice Tweezes list for TEM user ( Only Japanese) |
Jump to Events NEWS. M&M 2012 Microscopy & Microanalysis 2012 Meeting Date: July 29 – August 2, 2012 Venue: Phoenix Convention Center in downtown Phoenix, AZ.  |
| Link to HATA-Holder applied articles. New! High-angle triple-axis specimen holder for three-dimensional diffraction
contrast imaging in transmission electron microscopy S. Hataa, H. Miyazakib, S. Miyazakic, M. Mitsuharaa, M. Tanakad, K. Kanekod, K. Higashidad, K. Ikedaa, H. Nakashimaa, S. Matsumurae, J.S. Barnardf, J.H. Sharpf and P.A. Midgleyf a Department of Electrical and Materials Science, Kyushu University, Kasuga, 6-1 Kasugakoen, Kasuga, Fukuoka 816-8580, Japan b Mel-Build, Nishi-ku, Fukuoka 819-0052, Japan c FEI Company Japan Ltd., Minato-ku, Tokyo 108-0075, Japan d Department of Materials Science and Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan e Department of Applied Physics and Nuclear Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395, Japan f Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK Abstract Electron tomography requires a wide angular range of specimen-tilt for a reliable three-dimensional (3D) reconstruction. Although specimen holders are commercially available for tomography, they have several limitations, including tilting capability in only one or two axes at most, e.g. tilt–rotate. For amorphous specimens, the image contrast depends on mass and thickness only and the single-tilt holder is adequate for most tomographic image acquisitions. On the other hand, for crystalline materials where image contrast is strongly dependent on diffraction conditions, current commercially available tomography holders are inadequate, because they lack tilt capability in all three orthogonal axes needed to maintain a constant diffraction condition over the whole tilt range. We have developed a high-angle triple-axis (HATA) tomography specimen holder capable of high-angle tilting for the primary horizontal axis with tilting capability in the other (orthogonal) horizontal and vertical axes. This allows the user to trim the specimen tilt to obtain the desired diffraction condition over the whole tilt range of the tomography series. To demonstrate its capabilities, we have used this triple-axis tomography holder with a dual-axis tilt series (the specimen was rotated by 90° ex-situ between series) to obtain tomographic reconstructions of dislocation arrangements in plastically deformed austenitic steel foils. Highlights A double tilt–rotate specimen holder for diffraction contrast imaging in electron tomography. Precise alignment of a diffraction condition for tilt-series acquisition of TEM/STEM images. Complete visualization of 3D dislocation arrangements by dual-axis STEM tomography. Keywords: Electron tomography; Specimen holder; Diffraction contrast; Dislocation; Scanning transmission electron microscopy (STEM) Article Outline 1. Introduction 2. Concept and design of high-angle triple-axis specimen holder 2.1. High-angle double-tilt mechanism 2.2. Rotational and exchangeable specimen stage 3. Application of the high-angle triple-axis specimen holder 3.1. Experimental settings for dual-axis dislocation tomography 3.2. Tilt-series acquisition and tomographic 3D reconstruction 4. Discussion 4.1. Strengths and weaknesses of the high-angle triple-axis specimen holder 4.2. Limitations and experimental settings of dislocation tomography 5. Conclusions Publication: Ultramicroscopy Publisher: Elsevier (Copyright © 2011, Elsevier ) Article Ultramicroscopy, Volume 111, Issue 8, July 2011, Pages 1168-1175 Received 1 October 2010; revised 25 March 2011; accepted 29 March 2011. Available online 9 April 2011 You are able to get the full-text article at ScienceDirect. ( DOI: 10.1016/j.ultramic.2011.03.021) http://dx.doi.org/10.1016/j.ultramic.2011.03.021 New! DISLOCATION ELECTRON TOMOGRAPHY OF BOUNDARIES IN DEFORMED ALUMINIUMAmuthan Ramar*, Satoshi Hata**, Xiaoxu Huang***, Rafal E. Dunin Borkowski* and Grethe Winther*** * Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark ** Department of Engineering Sciences for Electronics and Materials, Kyushu University, Kasuga, Fukuoka 816-8580, Japan *** Danish-Chinese Center for Nanometals, Materials Research Division, Risø National Laboratory for Sustainable Energy, Technical University of Denmark, DK-4000 Roskilde Abstract Dislocation tomography has been applied to deformation-induced dislocation boundaries in tensile deformed aluminium. Using one diffraction vector a series of Scanning transmission electron microscopy (STEM) high-angle annular dark field (HAADF) images at a wide range of tilt angles has been acquired and reconstructed in three dimensions (3D). The data reveal the detailed dislocation arrangement wihtin a planar boundary and also the 3D shape of curved cell boundaries. http://www.rafaldb.com/papers/C-2010-09-Riso-Symposium-dislocation-tomography-of-deformed-Al.pdf New! 3D structures of alloys and nanoparticles observed by electron tomography Kazuhisa Sato, Kenta Aoyagi and Toyohiko J. Konno Laboratory for Advanced Analysis of Materials, Tohoku University. Abstract 3D structures of bulk alloys and nanoparticles have been studied by means of electron tomography using scanning transmission electron microscopy (STEM). In the case of nanoparticles of Fe-Pd alloy, particle size, shape, and locations were reconstructed by weighted backprojection (WBP), as well as by simultaneous iterative reconstruction technique (SIRT). We have also estimated the particle size by simple extrapolation of tilt-series original data sets, which proved to be quite powerful. We demonstrate that WBP yields a better estimation of the particle size in the z direction than SIRT does, while the latter algorithm is superior to the former from the viewpoints of surface roughness and dot-like artifacts. In contrast, SIRT gives a better result than WBP for the reconstruction of plate-like precipitates in Mg-Dy-Nd alloys, in respect of the plate thickness perpendicular to the z direction. We also show our recent results on the 3D-tomographic observations of microstructures in Ti-V-Al, Ti-Nb, Cu-Ag, and Co-Ni-Cr-Mo alloys obtained by STEM tomography. Article Optical Measurements, Modeling, and Metrology, Volume 5 Conference Proceedings of the Society for Experimental Mechanics Series, Volume 1/2011- Volume 9999999, Optical Measurements, Modeling, and Metrology, Volume 5, Pages 1-9 You are able to get the full-text article at SpringerLlink ( DOI: 10.1007/978-1-4614-0228-2_1 ) http://www.springerlink.com/content/h2567r721186w36p/ Characterization of Crack-Tip Dislocations and their Effects on Materials
FractureKenji Higashida, Masaki Tanaka, Sunao Sadamatsu Department of Materials Science and Engineering, Kyushu University Keywords: Crack, Dislocation, Shielding, Dislocations, Tomography, Abstract Three-dimensional structure of crack tip dislocations were investigated by combining scanning transmission electron microscopy (STEM) and electron tomography (ET) in silicon single crystals. P-type (001) silicon single crystals were employed. <110> cracks were introduced from an indent on the (001) surface. The specimen was heated at 873K in order to introduce dislocations at the crack tips. The specimen was thinned to include the crack tip in the foil by an iron milling machine. STEM-ET observation revealed the three-dimensional structure of crack tip dislocations. Their Burgers vectors were determined by using an invisibility criterion. The local stress intensity factor was calculated using the dislocation characters obtained in the observation in this study, indicating that the islocations observed were mode II shielding type dislocations. Article Journal Materials Science Forum (Volumes 654 - 656) Volume PRICM7 Edited by Jian-Feng Nie and Allan Morton Pages 2307-2311 You are able to get the full-text article at Scientific.Net. ( DOI: 10.4028/www.scientific.net/MSF.654-656.2307 ) http://www.scientific.net/MSF.654-656.2307 3-D structures of crack-tip dislocations and their shielding effect revealed
by electron tomography Masaki Tanaka*, Masaki Honda, Sunao Sadamatsu and Kenji Higashida Department of Materials Science and Engineering, Kyushu University, Motooka Fukuoka, 812-8581 Japan Abstract Three-dimensional structures of crack-tip dislocations in silicon crystals have been examined by combining scanning transmission electron microscopy and computed tomography. Cracks were introduced by a Vickers hardness tester at room temperature, and the sample was heated at 823 K for 1 h in order to introduce dislocations around the crack tips. Dislocation segments cut out from loops were observed around the crack tip. the three-dimensional structure of which was characterized by using by electron tomography. Their Burgers vectors including the sings were also determined by oscillating contrasts along dislocations. In order to investigate the effect of the dislocations on fracture behaviours, local stress intensity factor due to one dislocation was calculated, which indicates the dislocations observed were shielding type to increase fracture toughness. Keywords electron tomography, scanning transmission electron microscopy Article Journal of Electron Microscopy Received October 19, 2009. Revision received March 9, 2010. Accepted March 9, 2010. First published online: June 15, 2010 You are able to get the full-text article at Journal of Electron Microscopy.( DOI: doi: 10.1093/jmicro/dfq031 ) http://jmicro.oxfordjournals.org/content/early/2010/06/15/jmicro.dfq031.abstract Crack tip dislocations revealed by electron tomography in silicon single
crystalMasaki Tanakaa,a, Kenji Higashida,a, Kenji Kanekoa, b, Satoshi Hata,c, Masatoshi Mitsuhara,c a Department of Materials Science and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan b JST-CREST, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan c Department of Engineering Sciences for Electronics and Materials, Kyushu University, 6-1 Kasuga koen, Kasuga, Fukuoka 816-8580, Japan Abstract Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip. Keywords Electron tomography; Fracture; Dislocations; Transmission electron microscopy; Scanning transmission electron microscopy Article Scripta Materialia Volume 59, Issue 8, October 2008, Pages 901-904 Received 10 June 2008; revised 25 June 2008; Accepted 25 June 2008. Available online 6 July 2008. You are able to get the full-text article at ScienceDirect. http://www.sciencedirect.com/science/article/pii/S1359646208005046 Fabrication and characterization of TiN nanocomposite powders fabricated
by DC arc-plasma method K. Kaneko a, b, K. Kitawaki a, S. Sadayama c, H. Razavi a, J.C. Hernandez-Garrido d, P.A. Midgley d, H. Okuyama e, M. Uda e and Y. Sakka e, f a Department of Materials Science and Engineering, Graduate School of Engineering, Kyushu University, Fukuoka, Japan b JST-CREST, Japan c FEI Company Japan Ltd., Tokyo, Japan d Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK e Nano Ceramics Center, National Institute for Materials Science, Tsukuba, Ibaraki, Japan f WPI Center for MANA, National Institute for Materials Science, , Tsukuba, Ibaraki, Japan Abstract TiN nanocomposite powders with various morphologies were synthesized by DC arc-plasma method from Ti-Si ingot under N2-H2-Ar atmosphere. Microstructures of powders were characterized by powder X-ray diffraction method and transmission electron microscopy with compositional analysis, then morphologies by three-dimensional electron tomography. It was found that the powders were consisted of TiN nanoparticles covered by Ti5Si3 nanoparticles, which possibly suppressed the growth of facets and controlled the final morphologies of TiN-Ti5Si3 nanocomposite. Keywords XRD; TEM; Electron tomography; TiN; Nanocomposite Article Journal of Alloys and Compounds Volume 492, Issues 1-2, No.147 Pages 685-6904 March 2010 Received 24 September 2009; revised 29 November 2009; accepted 3 December 2009. Available online 9 December 2009. You are able to get the full-text article at ScienceDirect. http://linkinghub.elsevier.com/retrieve/pii/S0925838809025705 Japanese applied articles. Three dimensional tomographic technique applied to martensitic transformations
in Ti alloys (Only Japanese.）T.J. Konno T.Kiguchi, K.Sato Laboratory for Advanced Analysis of Materials, Tohoku University. IMR (KINKEN) Institute for Materials Research, Tohoku University, Aoba-ku, Sendai 980-8577, Japan 三次元トモグラフィー法を活用した形状記憶チタン合金のマルテンサイト変態の解明 http://www.imr.tohoku.ac.jp/jpn/library/houkoku/2010b/pdfsj20/0102konno.pdf回復・再結晶化過程における転位分布の高精度三次元可視化技術の開発 http://www.jfe-21st-cf.or.jp/jpn/hokoku_pdf_2009/17.pdf About acquisition method of the 3D Tomography of crystalline nanostructures using TEM. (Only Japanese.）電子線トモグラフィー技術情報記事のご紹介 文献名： 透過型電子顕微鏡を利用した結晶性材料の３次元ナノ形態解析 著者： 九州大学大学院工学研究院材料工学部門 准教授 金子 賢治 先生 刊行物名： センターニュース 分析機器解説シリーズ102 Vol.27 No.4，2008 発行者： 九州大学中央分析センター http://www.bunseki.cstm.kyushu-u.ac.jp/F/102.pdf 回復・再結晶化過程における転位分布の高精度三次元可視化技術の開発 (Only
Japanese.）東北大学金属材料研究所 教授 今野 豊彦 先生，准教授 木口 賢紀 先生，助教 佐藤 和久 先生 http://www.jfe-21st-cf.or.jp/jpn/hokoku_pdf_2009/17.pdf Development of the High Angle Triple Axis tomography specimen holder. (Only Japanese.） http://www.saga-ls.jp/images/file/books_publication/seikahoukokukai_houkokusho/H20nendo/04.pdf
Link to exchange partners. 4D forum of NIMS ( National Institute Materials Science )
http://www.geocities.jp/adachi_yst2/3Dindex.html
Kyushu Synchrotron Light Research Center. http://www.saga-ls.jp/
Workshop of Kyushu electron microscope technology (Only Japanese.） http://www.med.kyushu-u.ac.jp/nano/If you are a member of our Team Kyushu, please click log-in below (password protected).  Events. Microscopy & Microanalysis 2012 Meeting (M&M 2012)Date: July 29 – August 2, 2012 http://www.microscopy.org/MandM/2012/index.cfmVenue: Phoenix Convention Center in downtown Phoenix, AZ. Emotional events. ( Closed ) 2011 MRS FALL MEETINGDate: Nov 28 (Mon.) - Dec 2 (Fri.), 2011 http://www.mrs.org/fall2011/It is successfully closed. Venue: Hynes Convention Center, Boston, MA International Conference on Electron Nanoscopy & XXXII
Annual Meeting of EMSIDate: July 06 (Wed.) - July 08 (Fri.), 2011 http://www.emsi50dmrl.com/index.htmlIt is successfully closed. Venue: Ramoji Film City, Hyderabad India The 67th The Japanese Society of Microscopy (JSM-2011)Date: May 16 (Mon.) - May 18 (Wed.), 2011 http://jsm67.umin.jp/ It is successfully closed. Venue: Fukuoka Convention Center Fukuoka City in Kyushu Japan http://www.marinemesse.or.jp/eng/ 17th International Microscopy Congress ( IMC 17th )17th International Microscopy Congress IMC17 Date: September 19 (Sun.) - September 24 (Fri.), 2010 Venue: In the beautiful city of Rio de Janeiro, Brazil It is successfully closed. http://www.imc-17.com/ About IMC17 ( This phreae are quotqtion form imw17's website.) IMC to Revealing the Nanoworld in Life and Materials Sciences. IMC17 will be the event for an update on the challenges at the frontiers of applied scientific research, bringing together, through all forms of microscopy, advances on Nanotechnologies and applications, Medicine and health, Energy conversion, Environmental protection, and much more. The 71th Fall Meeting, 2010 by The Japan Society of Applied Physics (JSAP) 2010年秋季 第71回 応用物理学会学術講演会Date: September 14 to September 17, 2010 Venue: Nagasaki Univ. Bunkyo Campus. ( 1-14 Bunkyo-machi Nagasaki-shi, Nagasaki in Kyushu, 852-8521 Japan ) It is successfully closed. http://www.jsap.or.jp/english/meeting-events/annualmeeting.htmlAbout JSAP ( Below phreae are quotqtion form JSAP website.) The Japan Society of Applied Physics (JSAP) sponsors two major academic meetings in the spring and fall of each year. The spring meeting in the Tokyo area usually has about 9,000 participants, while the fall meeting elsewhere in Japan has approximately 6,000 participants, with nearly 4,000 presentations and active discussions. In addition to general research presentations (oral/poster) at 17 individual sessions and joint sessions (since the spring of 2008), the Society convenes invited research presentations including symposia concerning specific themes proposed by a single conference session or joint conference sessions. JSAP also provides an opportunity for communication between industry, government and academia by setting up the exhibit on physical and chemical and measuring instrument. 31th Risø International Symposium on Materials ScienceTheme: Challenges in materials science and possibilities in 3D and 4D characterization techniques. Date: 6-10 September 2010 Venue: The symposium will take place at the Niels Bohr Auditorium (building 112) at Risø DTU. It is successfully closed. http://www.risoe.dtu.dk/en/Conferences/symp31.aspx M&M 2010Microscopy & Microanalysis 2010 M&M2010 Date: Aug 01, 2010 - Aug 05, 2010 Venue: Convention Center, Portland, OR United States http://microscopy.org/MandM/2010/index.cfmIt is successfully closed. iib2010 Date: June 27 (Sun.) - July 2 (Fri.), 2010 Venue: Shima Kanko Hotel The Classic http://jecs.org/iib2010/index.html It is successfully closed. About iib2010 iib2010 which is held every three years, represents a unique international forum bringing together specialists working in different areas of interface science. Researchers will have a unique opportunity to exchange views and ideas with colleagues investigating the diverse aspects of interfacial behavior. iib2010 will be focused on the atomic-scale characterization and properties of interfaces, including atomic level modeling, microscopy, spectroscopy, thermodynamics, mechanical, electrical and magnetic properties. Organized by : iib2010 organizing committee Institute of Engineering Innovation, The University of Tokyo AMTC2 Date: June 24 (Thu.) - 26(Sat.), 2010 Venue: Nagoya Congress Center http://jecs.org/amtc2/It is successfully closed. About AMTC2 The symposium series is organized by the Nanostructures Research Laboratory of the Japan Fine Ceramics Center (JFCC). JFCC are to provide regular opportunities to discuss state-of-the-art techniques and research involving advanced microscopy and theoretical calculations. Chairpersons: T. Hirayama, Y. Ikuhara, I. Tanaka The offical language for the symposium will be English. JSM-2010 The 66th Annual Meeting of the Japanese Society of Microscopy 日本顕微鏡学会 第66回 学術講演会Date: May 23 (Sun.) - 26(Wed.), 2010 Venue: Nagoya Congress Center http://jsm66.umin.jp/ It is successfully closed. About JSM-2010 Theme: High-Throughput Imaging for Innovation. The scientific program will encompass such as optical microscopy, electron microscopy, scanning probe microscopy. Applications will encompass such as materials, medical and biological sciences. The offical language for the symposium will be almost Japanese. 2009 FEMMS symposium, held at Huis Ten Bosch in Kyushu island, September 27 - October
2 (2009), it is closed. http://www.femms2009.org/
 It is successfully closed.About FEMMS 2009 The Twelfth Frontiers of Electron Microscopy in Materials Science FEMMS is an international symposium series focused on the application of electron microscopy in the field of materials science. It has been held biennially since 1987. This meeting typically includes over 50 invited speakers, who are the most influential scientists in the field. General contributed papers on state-of-the-arts are also accepted and are presented, FEMMS attracts the best and brightest of the electron microscopy community. And affords significant opportunities for students and post docs to meet and have substantive discussions with the leaders in the field. Note Product design or product specifications are subject to change without prior notice. FEI, FEI Company, FEI (stylized logo) and Tecnai, Titan are either registered trademarks or trademarks of FEI Company Gatan, Gatan Company, DM, Digital Micrograph and USC Camera
are either registered trademarks or trademarks of GATAN Company. Mel-Build products include technology with patent protection and patents pending. Mel-Build products are regulated to legislation of "Foreign exchange and international trade". Export and resale of Mel-Build products, must be officially pre-approved. Escape clause
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Mel-Buildの夢
電子顕微鏡を用いていらっしゃる世界の研究者の方々へ、
Mel-Buildの技術が少しでも役立つことで、世界の科学技術の発展に貢献出来ることを夢としています。。
特に、電子線トモグラフィー ３次元ナノ構造解析 ナノスケールの3次元解析 3次元形態・分布解析をサポートすることで、
多様な電顕顕微鏡を用いた下記研究に支援できることを自負します。
主な研究テーマ
原子配列・定量解析
短範囲-長範囲規則化過程の研究
規則-不規則変態の研究
超微細粒組織化と微細構造解析の研究
フラーレンの微細構造に関する研究
高輝度発光の研究
高保磁力の研究
電磁波吸収材料の研究
磁性半導体積層膜の微細構造評価の研究
金属系超伝導体の研究
高密度格子欠陥新材料の研究
超塑性特性の研究
スピンホール効果の研究 スピンエレクトロニクス（スピントロニクス）の研究
錯体水素化物群の研究
スピンゼーベック効果の研究
強磁性ジョセフソン共鳴の研究 など
テーマを解析する手段
透過型電子顕微鏡法 析電子顕微鏡法 透過型電子顕微鏡暗視野法 高分解能電子顕微鏡法 収差補正透過電子顕微鏡法
エネルギーフィルター EELS PEELS 特定X線分析法 EDS EDAX
鏡走査透過電子顕微鏡法 STEM HAADF‐STEM モンテカルロシミュレーション ナノインデント法
組成傾斜法 FIB マイクロサンプリング法 電子チャネリングＸ線分光法 ALCHEMI 動力学的回折理論 など
オブジェクト
超格子 超分子 結晶化 微細組織 粒界 ひずみ 格子欠陥 先進耐熱鋼 超塑性 スピネル型酸化物結晶
析出物 結晶材 成長過程 料結晶配向化の相関 長周期規則化ナノ組織形成過程の解明及び制御
相変態過程 相変態 長周期構造 逆位相境界 Cu添加による鋼の強化機構 基板表面構造 積層膜 磁性薄膜 方位制御 など
テーマとする材料
次世代デバイス SrTiO3/Nb-SrTiO3 シリコン系半導体結晶 シリコン Si-Ge 非晶質SiGe薄膜 InGaAsP
GOI Ge薄膜 SiO2 COE アパタイト
セラミックス Al2O3 ZrO2 SrTiO3 ZnO, TiO2
フェライト鋼 マルテンサイト 鉄シリサイド クロム系鉄鋼
金属系超伝導体Nb3Sn MgB2 超伝導材料 超伝導 磁性薄膜 超伝導薄膜 Y系超電導線材 β-FeSi2薄膜（結晶薄膜）高輝度発光
NdFeB Nd-Fe-B ネオジムー鉄-ボロン 焼結磁石（Tb改質）ネオジム磁石 電磁波吸収材 Znフェライト被覆 軟磁性複合材
Al-Li Al3Z Al-Mg-Li-Zr Mg-Al-Zr 軽金属系合金
TiAl系構造材料 Ti-Al系耐熱材料 Ti-Al-Mo合金 Ni-Mo系合金 Ti-Nb-Ta-Zr系合金
薄膜 線材 Fe-Cu ダイヤモンド薄膜 フラーレン Cs3C60 カーボンナノチューブ
LiBH4 など
プロセス
急冷凝固法 金属誘起結晶化法 低温結晶化法 エピタキシャル成長法 水素処理法 MOCVD法 PLD法 スパッタ法 ECAP法
ボールミリング処理法 プラズマ回転電極法 プラズマイオン注入法PREP プラズマレーザー堆積法 AIC法 イオンビーム合成法
FIB Focused Ion Beam法 STSP法 Severe Torsion Straining Process エックス線照射法 急冷遠心鋳造プロセス法
CVD法 エッチング法 など
効果
機能材料の開発 新材料創製 機能イノベーション被覆処理 収着処理 水素吸蔵合金材料の開発 光電変換
有機半導体 ポストシリコンデバイス など
夢
水素エネルギーシステム 高密度水素貯蔵材料
量子コンピューター 超高感度磁気センサー 揮発性磁気記憶素子 MRAM 金属ガラス
高性能燃料電池 高性能太陽電池 スピン電池 高性能リチウムイオン電池 透明エレクトロニクス 生体用合金 など
絶対目標
地球環境保全
