In-situ Nano Order Tensile TEM Holder

tensile tem holder

Nano-Order Tensile : min.step 1nm
Prepare 2 type holder of Polymer and material model
Cartridge structure: Easy link to Microtome and FIB

Polymer and materila Nano order Tensile data Collection

tensile tem holder

Cu-6Sn HR 5nm Tensile

tensile tem holder

Prof. M. Murayama (Virginia Tech)

tensile tem holder

Microscopy, 67, 296-300 (2018).
Prof. Jinnai Tohoku University

As shown in the video above, it is possible to perform a tensile test by dynamic observation.

Cartridge Structure

Material Model
Co-developer Prof.Kazuhisa Sato/Prof.Satoshi Hata

tensile tem holder

Standard design

tensile tem holder

Thin Slit design for FIB

tensile tem holder

Set the sample on the cartridge in various ways.
The cartridge design can be changed depending
on the sample set method.
Then, the cartridge on which the sample is placed set
on the tem holder, and the cartridge is tensile by deforming.

TEM holder specification

tensile tem holder
Material Model
Tensile resolution: 1nm/step 3nm/dec
Tensile Distance: 200μm
Tilt Angle: TFS ±65°
JEOL HR PP ±60°/ UHR PP ±10°
Cartridge Model: Prepare FIB and Bulk sample
Soft Material Model
Tensile resolution: 1nm/step 3nm/dec
Tensile Distance: JEOL Model 800%
TFS 200%
Tilt Angle: JEOL HR PP ±20°/ UHR PP ±10°
TFS ±20°
Cyclic Straining Mode: JEOL Available
TFS Not Function
Cartridge Model: Prepare Microtome and FIB